The SDI MasterScan/WinScan® suite is one of the most powerful motion control and acquisition packages available — designed from the ground up as a true Windows application, not a DOS or Unix system migrated to a new platform. With a user base of over 200 systems worldwide, the modular software has evolved directly from the requests of the technicians who operate it every day.
Targeted at high-volume test lab users, the core design goals are simple: ease of use and the fastest possible inspection time.
Advanced Motion Control
Designed specifically for ultrasonic applications, MasterScan features ultrasonic functional axes and scripted scan plans — complex motion control and acquisition activities unique to UT are available through simple commands using ultrasonic terminology, not generic robotics language. Operators chain together individual motion commands, scan plans, and instrument setups to build complex scans.
| Application | Ultrasonic-specific motion control |
| Programming | Scripted scan plans, chained commands |
| Interoperability | Import/export scan plans to CAD |
Data Acquisition & Analysis
One of the most versatile ultrasonic acquisition and analysis packages available for production inspection and defect evaluation — approved and used by all major aerospace prime contractors. In standard configuration, WinScan® captures up to eight channels of 12-bit peak-detected data in C-scan format, with true multi-tasking so scanning, plotting, and viewing stored files can happen simultaneously without a drop in speed.
| Channels | Up to 8, 12-bit peak-detected |
| Format | C-scan, with cluster analysis for automatic defect ID |
| Approval | Used by all major aerospace prime contractors |
Defect Evaluation
An operator tags an area of interest on the data file, and the system automatically drives back and re-scans that area — MiniScan provides B-scan and full waveform capture for detailed defect characterization, without re-running the entire part.
| Trigger | Operator-tagged region of interest |
| Output | B-scan, full waveform capture |
Programmable Flaw Detector
When paired with WinScan®, instrument parameters can be changed on-the-fly as part of the scan plan — a gate can be set to follow the back wall of a part with rapidly changing thickness, or follow a bond line under similar conditions, without operator intervention mid-scan.
| Integration | On-the-fly parameter changes with WinScan® |
| Use case | Variable thickness parts, bond line following |
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